A Primer to Atomic Force Microscopy
de Stephen Ogg Efstratios Koutris Keibock Lee
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A Primer to Atomic Force Microscopy
The next frontier in science and technology lies in nanoscale research, engineering and development. Discoveries and innovations involving carbon nanotubes, semiconductor devices with nanoscale trenches, nano-based cancer therapies, and novel methods of drug delivery will make humanity stronger, healthier, and more productive. And at the heart of all these advances is one critical tool: atomic force microscopy.
Atomic force microscopy allows those working at the molecular scale to see, measure, and characterize from synthesized materials to live cells. It also provides a means for atomic manipulation, allowing for advanced nanofabrication that will lead to some of the most exciting new technologies of the future.
This booklet will introduce the basics of atomic force microscopy, how it works, and how you can use it to do amazing work at the nanoscale.
The next frontier in science and technology lies in nanoscale research, engineering and development. Discoveries and innovations involving carbon nanotubes, semiconductor devices with nanoscale trenches, nano-based cancer therapies, and novel methods of drug delivery will make humanity stronger, healthier, and more productive. And at the heart of all these advances is one critical tool: atomic force microscopy.
Atomic force microscopy allows those working at the molecular scale to see, measure, and characterize from synthesized materials to live cells. It also provides a means for atomic manipulation, allowing for advanced nanofabrication that will lead to some of the most exciting new technologies of the future.
This booklet will introduce the basics of atomic force microscopy, how it works, and how you can use it to do amazing work at the nanoscale.
Características y detalles
- Categoría principal: Medicina y ciencias
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Características: 15×23 cm
N.º de páginas: 106 - Fecha de publicación: abr. 14, 2014
- Idioma English
- Palabras clave atomic force microscopy, scanning probe microscopy, nanoscale microscope, AFM, nanotechnology
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